Yongwoo Kwon, Byoungnam Park, Heesun Yang, Jin-Ha Hwang, Dae-Hwan Kang, Hongsik Jeong, Yunheub Song "Modeling of data retention statistics of phase-change memory with confined- and mushroom-type cells" Microelectronics Reliability, Volume 63, August 2016, Pages 284-290.
Address
Dep. of Semiconductor Engineering, POSTECH 77,
Cheongam-ro, Nam-Gu, Pohang, Gyeongbuk-Do, Korea
(37673)
TEL: +82-54-279-7085
E-mail: daehwankang@postech.ac.kr
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Address
Dep. of Semiconductor Engineering, POSTECH 77, Cheongam-ro, Nam-Gu, Pohang, Gyeongbuk-Do, Korea (37673)
TEL: +82-54-279-7085
E-mail: daehwankang@postech.ac.kr
Copyright ⓒ 2023. Chalcogenide Semiconductor Lab (CSL) All rights reserved | Designed by greypixel
